Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

Four principal methods govern the preparation of samples for XRF analysis, each representing a different trade-off between analytical quality and speed/cost of preparation. A method involving the ...

Although next-generation sequencing (NGS) keeps giving—exploring the human genome and revolutionizing our knowledge of health and disease—it needs to take a little, too. At the very least, NGS ...

The Helmholtz Center for Materials and Energy in Berlin, Germany (HZB, originally known as Hahn-Meitner Institute, HMI) has developed a novel technique for the cross-sectional sample preparation for ...