Abstract: The importance of the Insulate Gate Bipolar Transistor reliability has significantly increased due to the widespread use and target application of these devices which includes power ...
Abstract: In harsh radiation environments, nanoscale CMOS latches have become more and more vulnerable to triple-node upsets (TNUs). This paper first proposes a latch design that can self-recover from ...
"Rail modernization has delivered unprecedented benefits, yet these advances have simultaneously introduced safety and security challenges. Designers and manufacturers now face the critical task of ...